كيف الكثير تفعل أنت تعرف عن الذرية القوة المجهر

كيف الكثير تفعل أنت تعرف عن الذرية القوة المجهر

Since the atomic force microscope is based on the theory of interatomic forces, the surface of the tested sample extends from conductors and semiconductors to the field of insulators, and its lateral resolution can reach 0.101nm. At present, according to the contact between the probe tip and the sample surface, the contact forms of the atomic force microscope are divided into contact type (C type), non-contact type (NC type), and intermittent contact type (IC type).